Our systems are now restored following recent technical disruption, and we’re working hard to catch up on publishing. We apologise for the inconvenience caused. Find out more

Recommended product

Popular links

Popular links


Structure and Properties of Multilayered Thin Films

Structure and Properties of Multilayered Thin Films

Structure and Properties of Multilayered Thin Films

Volume 382:
Bruce M. Clemens, Stanford University, California
Bruce M. Lairson, Rice University, Houston
Tai D. Nguyen, Lawrence Berkeley Laboratory, Berkeley
Katsuaki Sato, Tokyo University of Agriculture and Technology
Sung-Chul Shin, Korea Institute of Science and Technology, Taejon
November 1995
382
Hardback
9781558992856
$29.99
USD
Hardback

    Layered thin film structures often have unusual properties which make them appealing in a wide range of applications. Fabrication of submicron and nanometer multilayers can produce metastable phases that many not be predicted from the bulk equilibrium phase diagrams. Understanding the growth, structure, stability and properties of multilayers, and controlling their microstructure through processing, are important in many applications. This book focuses on the relationship of structure and processing to the properties that are relevant to all researchers in the field of multilayers. Topics include: phase transformation and reaction kinetics; processing and growth; structural characterization; magnetic, electronic and optical properties; mechanical properties; X-ray optics; thin-film interfaces.

    Product details

    November 1995
    Hardback
    9781558992856
    496 pages
    0.864kg
    Out of stock in print form with no current plan to reprint
      Editors
    • Bruce M. Clemens , Stanford University, California
    • Bruce M. Lairson , Rice University, Houston
    • Tai D. Nguyen , Lawrence Berkeley Laboratory, Berkeley
    • Katsuaki Sato , Tokyo University of Agriculture and Technology
    • Sung-Chul Shin , Korea Institute of Science and Technology, Taejon