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Polycrystalline Metal and Magnetic Thin Films 2000

Polycrystalline Metal and Magnetic Thin Films 2000

Polycrystalline Metal and Magnetic Thin Films 2000

Volume 615:
Bruce M. Clemens, Stanford University, California
Lynne Gignac, IBM T J Watson Research Center, New York
James M. MacLaren, Tulane University School of Medicine, Louisiana
Olivier Thomas, Université d'Aix-Marseille
June 2014
615
Unavailable - out of print
Paperback
9781107413122
Out of Print
Paperback
Hardback

    The unprecedented growth in the semiconductor, electronics, and storage industries is the result of continued miniaturization of circuit devices, increases in chip functionality, and increased storage capacity and performance, along with a decrease in per-function cost. Hardware shrinkage has taken place leading to similar decreases in the dimensions of interconnection wires, contact metallization, and magnetic storage footprints. The important role of surfaces, interfaces, defects, and impurities has raised serious materials questions about how to control the properties of polycrystalline thin films used in applications requiring tight performance tolerances and the understanding of these, during the evolution of various film properties with time and temperature, is critical to the successful design and development of smaller devices. This book, first published in 2001, focuses on the directions taken to understand and control the properties of polycrystalline materials. Topics include: magnetic thin films and structures; polycrystalline metal films - microstructure and grain evolution and stress and mechanical properties of thin films.

    Product details

    June 2014
    Paperback
    9781107413122
    204 pages
    229 × 152 × 11 mm
    0.28kg
    Unavailable - out of print
      Editors
    • Bruce M. Clemens , Stanford University, California
    • Lynne Gignac , IBM T J Watson Research Center, New York
    • James M. MacLaren , Tulane University School of Medicine, Louisiana
    • Olivier Thomas , Université d'Aix-Marseille