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Thin Films:

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Thin Films:

Stresses and Mechanical Properties I
Volume 130:
John C. Bravman, Stanford University, California
William D. Nix, Stanford University, California
David M. Barnett, Stanford University, California
David A. Smith, IBM Research Center, Yorktown Heights, New York
June 2014
130
April 1989
Unavailable - out of print
Paperback
9781107410855
Out of Print
Paperback
USD
Hardback

    Product details

    April 1989
    Hardback
    9781558990036
    0 pages
    228 × 152 mm
    0.864kg
    Out of stock in print form with no current plan to reprint
      Editors
    • John C. Bravman , Stanford University, California
    • William D. Nix , Stanford University, California
    • David M. Barnett , Stanford University, California
    • David A. Smith , IBM Research Center, Yorktown Heights, New York