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Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures

Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures

Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures

Volume 184:
V. Swaminathan, AT&T Bell Laboratories, Breinigsville, Pennsylvania
S. J. Pearton, AT&T Bell Laboratories, New Jersey
M. O. Manasreh, Electronic Technology Laboratory, Wright Patterson Air force Base, Dayton, Ohio
No date available
184
Paperback
9781107410145
Paperback

    Product details

    No date available
    Hardback
    9781558990739
    298 pages
    229 × 152 × 17 mm
    0.57kg
      Editors
    • V. Swaminathan , AT&T Bell Laboratories, Breinigsville, Pennsylvania
    • S. J. Pearton , AT&T Bell Laboratories, New Jersey
    • M. O. Manasreh , Electronic Technology Laboratory, Wright Patterson Air force Base, Dayton, Ohio