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Thin Films:

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Thin Films:

Thin Films:

Stresses and Mechanical Properties I
Volume 130:
John C. Bravman, Stanford University, California
William D. Nix, Stanford University, California
David M. Barnett, Stanford University, California
David A. Smith, IBM Research Center, Yorktown Heights, New York
No date available
130
Paperback
9781107410855
Paperback
    Description

    Product details

    No date available
    Hardback
    9781558990036
    0 pages
    228 × 152 mm
    0.864kg

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    About the authors
      Editors
    • John C. Bravman , Stanford University, California
    • William D. Nix , Stanford University, California
    • David M. Barnett , Stanford University, California
    • David A. Smith , IBM Research Center, Yorktown Heights, New York

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