Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures

Degradation Mechanisms in III-V Compound Semiconductor Devices and Structures
Volume 184:
V. Swaminathan, AT&T Bell Laboratories, Breinigsville, Pennsylvania
S. J. Pearton, AT&T Bell Laboratories, New Jersey
M. O. Manasreh, Electronic Technology Laboratory, Wright Patterson Air force Base, Dayton, Ohio
S. J. Pearton, AT&T Bell Laboratories, New Jersey
M. O. Manasreh, Electronic Technology Laboratory, Wright Patterson Air force Base, Dayton, Ohio
June 2014
184
January 1991
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9781107410145
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January 1991Hardback
9781558990739
298 pages
229 × 152 × 17 mm
0.57kg
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- V. Swaminathan , AT&T Bell Laboratories, Breinigsville, Pennsylvania
- S. J. Pearton , AT&T Bell Laboratories, New Jersey
- M. O. Manasreh , Electronic Technology Laboratory, Wright Patterson Air force Base, Dayton, Ohio
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