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Advances in Surface and Thin Film Diffraction

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Advances in Surface and Thin Film Diffraction

Advances in Surface and Thin Film Diffraction

Volume 208:
Ting C. Huang, IBM Almaden Research Center, New York
Philip J. Cohen, University of Minnesota
David J. Eaglesham, AT&T Bell Laboratories, New Jersey
April 1991
208
Hardback
9781558991002
$40.99
USD
Hardback
Paperback
    Description

    Product details

    April 1991
    Hardback
    9781558991002
    398 pages
    229 × 22 × 152 mm
    0.7kg
    Available

    Often bought together

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    About the authors
      Editors
    • Ting C. Huang , IBM Almaden Research Center, New York
    • Philip J. Cohen , University of Minnesota
    • David J. Eaglesham , AT&T Bell Laboratories, New Jersey

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