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Thin Films — Structure and Morphology

Thin Films — Structure and Morphology

Thin Films — Structure and Morphology

Volume 441:
Robert C. Cammarata, Naval Research Laboratory Washington, D.C.
Eric H. Chason, Sandia National Laboratories Albuquerque
Theodore L. Einstein, University of Maryland, College Park
Ellen D. Williams, University of Maryland, College Park
Daryush Lla, Alabama A&M University Normal
Steven C. Moss, The Aerospace Corporation Los Angeles
July 1997
441
Hardback
9781558993457
£22.99
GBP
Hardback

    An interdisciplinary group of materials scientists, physicists, chemists and engineers come together in this book to discuss recent advances in the structure and morphology of thin films. Both scientific and technological issues are addressed. Work on thin films for a host of applications including microelectronics, optics, tribology, biomedical technologies and microelectromechanical systems (MEMS) are featured. Topics include: kinetics of growth; grain growth; instabilities, segregation and ordering; silicides; metallization; stresses in thin films; deposition and growth simulations; energetic growth processes; diamond films and carbide and nitride films.

    Product details

    July 1997
    Hardback
    9781558993457
    793 pages
    240 × 160 mm
    1.273kg
    Out of stock in print form with no current plan to reprint
      Editors
    • Robert C. Cammarata , Naval Research Laboratory Washington, D.C.
    • Eric H. Chason , Sandia National Laboratories Albuquerque
    • Theodore L. Einstein , University of Maryland, College Park
    • Ellen D. Williams , University of Maryland, College Park
    • Daryush Lla , Alabama A&M University Normal
    • Steven C. Moss , The Aerospace Corporation Los Angeles