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High Resolution Electron Microscopy of Defects in Materials

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High Resolution Electron Microscopy of Defects in Materials

High Resolution Electron Microscopy of Defects in Materials

Volume 183:
Robert Sinclair, Stanford University, California
David J. Smith, Arizona State University
Ulrich Dahmen, Lawrence Berkeley Laboratory, Berkeley, California
August 1990
183
Unavailable - out of print
Hardback
9781558990722
Out of Print
Hardback
Paperback
    Description

    Product details

    August 1990
    Hardback
    9781558990722
    420 pages
    229 × 152 × 24 mm
    0.73kg
    Unavailable - out of print

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    About the authors
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    • Robert Sinclair , Stanford University, California
    • David J. Smith , Arizona State University
    • Ulrich Dahmen , Lawrence Berkeley Laboratory, Berkeley, California

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