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Sub-Half-Micron Lithography for ULSIs

Sub-Half-Micron Lithography for ULSIs

Sub-Half-Micron Lithography for ULSIs

Katsumi Suzuki, NEC Corporation, Tsukuba, Japan
Shinji Matsui, Nano-scale Science and Technology Group, Himeji Institute of Technology
Yukinori Ochiai, NEC Corporation, Tsukuba, Japan
November 2005
Paperback
9780521022347
NZD$71.95
inc GST
Paperback

    In semiconductor-device fabrication processes, lithography technology is used to print circuit patterns on semiconductor wafers. The remarkable miniaturization of semiconductor devices has been made possible only because of the continuous progress in lithography technology. However, for the trend of ever-increasing miniaturization to continue a breakthrough in lithography technology is now needed. This book describes advanced techniques under development in Japan and elsewhere that represent the key to future semiconductor-device fabrication. The background to developments in lithography technology, trends in ULSI technology and future prospects are reviewed, and the requirements that future lithography technology must meet are described. Several important lithography methods, such as deep UV lithography, X-ray lithography, electron-beam lithography, and focused ion-beam lithography are described in detail by experts in each area. The principles underlying each of these methods are illustrated at the beginning of each chapter to help the reader understand the basis of the different approaches.

    Product details

    November 2005
    Paperback
    9780521022347
    344 pages
    245 × 179 × 18 mm
    0.616kg
    103 b/w illus. 43 tables
    Available

    Table of Contents

    • 1. Introduction Masao Fukuma
    • 2. Optical lithography Kunihiko Kasama, Shinji Okazaki, Hisatake Sano and Wataru Wakamiya
    • 3. X-ray lithography Kimiyoshi Deguchi, Teruo Hosokawa, Sunao Ishihara and Katsumi Suzuki
    • 4. Electron beam lithography Takayuki Abe, Koichi Moriizumi, Yukinori Ochiai, Norio Saitou, Tadahiro Takigawa and Akio Yamada
    • 5. Ion beam lithography Masanori Komuro and Shinj Matsui
    • 6. Resists Hiroshi Ban, Tadayoshi Kokubo, Makoto Nakase and Takeshi Ohfuji
    • 7. Metrology, defect inspection and repair Tadahito Matsuda, Toru Tojo and Seiichi Yabumoto
    • Index.
      Contributors
    • Masao Fukuma, Shinji Okazaki, Hisatake Sano, Wataru Wakamiya, Kimiyoshi Deguchi, Teruo Hosokawa, Sunao Ishihara, Katsumi Suzuki, Takayuki Abe, Koichi Moriizumi, Yukinori Ochiai, Norio Saitou, Tadahiro Takigawa, Akio Yamada, Masanori Komuro, Shinj Matsui, Hiroshi Ban, Tadayoshi Kokubo, Makoto Nakase, Takeshi Ohfuji, Tadahito Matsuda, Toru Tojo, Seiichi Yabumoto

    • Editors
    • Katsumi Suzuki , NEC Corporation, Tsukuba, Japan
    • Shinji Matsui , Nano-scale Science and Technology Group, Himeji Institute of Technology
    • Yukinori Ochiai , NEC Corporation, Tsukuba, Japan