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Properties and Processes at the Nanoscale - Nanomechanics of Material Behavior

Properties and Processes at the Nanoscale - Nanomechanics of Material Behavior

Properties and Processes at the Nanoscale - Nanomechanics of Material Behavior

Volume 1424:
Peter Anderson, Ohio State University
Neville Moody, Sandia National Laboratories, Peru
David Bahr, Washington State University
Ralph Spolenak, ETH Zurich
September 2012
1424
Hardback
9781605114019
Out of Print
Hardback

    Symposium SS, 'Properties and Processes at the Nanoscale-Nanomechanics of Material Behavior', was held November 28–December 2 at the 2011 MRS Fall Meeting in Boston, Massachusetts. For two decades, the MRS meetings have had a significant presence in hosting symposia focused on nanomechanical behavior of materials. This symposium continued this strong tradition by focusing on both methods of testing and the resulting unique properties in small volumes of materials. Two main thrusts are evident from the field at this time: the use of small-scale tests to examine a locally small structure or defect (i.e., something you cannot accomplish with a macroscopic test) and the use of nanomechanics to determine nm-scale mechanisms that control macroscopic mechanical behavior. This selection of papers from the symposium highlight the breadth of work presented at the symposium.

    Product details

    September 2012
    Hardback
    9781605114019
    164 pages
    236 × 156 × 15 mm
    0.38kg
    111 b/w illus. 18 tables
    Unavailable - out of print

    Table of Contents

    • 1. Mechanical behavior of ion-irradiated Fe-Cr alloys investigated by spherical indentation
    • 2. The role of stacking fault energy on the indentation size effect of FCC pure metals and alloys
    • 3. Measuring size-dependent mechanical properties of electrospun polystyrene fibers using in situ AFM-SEM
    • 4. Recording IR spectra for individual electrospun fibers using an in situ AFM-synchrotron technique
    • 5. Determining mechanical properties of escherichia coli by nanoindentation
    • 6. Failure of bone at the sub-lamellar level using in situ AFM-SEM investigations
    • 7. Improvement of adhesive strength of polyacetal by irradiation of vacuum ultraviolet light and deposition of nanometer-sized particles simultaneously using laser ablation
    • 8. Individual electrospun poly(vinyl alcohol) nanofiber wetting using AFM
    • 9. Nanoscale dynamic viscoelastic measurements at elevated temperature
    • 10. Nanomechanical properties of teflon amorphous fluoropolymer – MWCNT bilayer films
    • 11. Testing the limits of small scale plasticity with thin wires in torsion
    • 12. Dislocation dynamics simulations of junctions in hexagonal close-packed crystals
    • 13. Deformation and fracture of oxides fabricated on 304L stainless steel via pulsed laser irradiation
    • 14. Activation energy and blistering rate in hydrogen-implanted semiconductors
    • 15. An examination of the indentation size effect and bi-linear behavior of FCC metals
    • 16. Studies of nanomechanical properties of pulsed laser deposited NbN films on Si using nanoindentation
    • 17. Development of objective type atomic force microsocopy for PSISCM-nanoindentation combined system
    • 18. Measuring residual stress on the nanometer scale – novel tools for fundamental and applied research
    • 19. Dynamic nanoscale in situ TEM tribology
    • 20. Nanoparticle enhanced solders for increased solder reliability
    • 21. Effect of van der Waals interaction strength and nanocluster size on the dynamical and mechanical properties of 1,4-cis-polybutadiene melts
    • 22. Influence of surface segregation on the mechanical property of metallic alloy nanowires
    • 23. Probing strain and microstrain in nanostructured thin layers
    • 24. Dielectric gradient force actuation with on-chip electrode and free-space optical measurement of SiNx nanomechanical resonator.
      Contributors
    • Christopher D. Hardie, Steve G. Roberts, Andrew J. Bushby, D. E. Stegall, M. A. Mamun, A. A. Elmustafa, Russell J. Bailey, Beatriz Cortes-Ballesteros, Hao Zhang, Congwei Wang, Asa H. Barber, Urszula Stachewicz, Fei Hang, Himadri S. Gupta, Mark D. Frogley, Gianfelice Cinque, C. A. Wright, C. J. Sullivan, B. Crawford, L. D. Britt, Ines Jimenez-Palomar, Akihiro Takeichi, Yasushi Okamoto, Hirozumi Azuma, Shuangwu Li , Jiping Ye, Satoshi Shimizu, R. L. Schoeppner, A. Qiu, D. D. Stauffer, R. C. Major, J. L. Skinner, T. Zifer, G. O'Bryan, A. Vance, W. W. Gerberich, D. F. Bahr, N. R. Moody, Julien Feuvrier, Dong V. Dong, David J. Dunstan, Chi-Chin Wu, Sylvie Aubry, Peter W. Chung, Athanasios Arsenlis, Samantha K. Lawrence, Douglas D. Stauffer, Ryan C. Major, David P. Adams, Daniel J. Pyke, Robert G. Elliman, Jeffrey C. McCallum, A. H. Farha, Y. Ufuktepe, H. E. Elsayed-Ali, M. Fujitsuka, M. Yamaguchi, S. Ueno, R. B. Wehrspohn, M. Krause, C. Schriever, A. J. Lockwood, K. Anantheshwara, M. S. Bobji, B. J. Inkson, Omid Mokhtari, Ali Roshanghias, Roya Ashayer, Hiren R. Kotadia, Farzad Khomamizadeh, Amir H. Kokabi, Michael P. Clode, Mark Miodownik, Samjid H. Mannan, Canan Atilgan, Ibrahim Inanc, Ali Rana Atilgan, Aditi Datta, Zhiyao Duan, Guofeng Wang, Gianguido Baldinozzi, David Simeone, Dominique Gosset, Jean-Francois Bérar, Sungwan Cho, Myung Rae Cho, Seung-Bo Shim, Yun Daniel Park

    • Editors
    • Peter Anderson , Ohio State University
    • Neville Moody , Sandia National Laboratories, Peru
    • David Bahr , Washington State University
    • Ralph Spolenak , ETH Zurich