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Nondestructive Characterization of Materials in Aging Systems

Nondestructive Characterization of Materials in Aging Systems

Nondestructive Characterization of Materials in Aging Systems

Volume 503:
Robert L. Crane, Wright Patterson Air Force Base, WPAFB, Ohio
Jan D. Achenbach, Northwestern University, Illinois
Surendra P. Shah, Northwestern University, Illinois
Theodore E. Matikas, University of Dayton, Ohio
Pierre T. Khuri-Yakub, Stanford University, California
Robert S. Gilmore, General Electric, Schenectady
June 2014
503
Paperback
9781107413573
Out of Print
Paperback
Hardback

    Economics often dictate the use of structures well beyond their design lives. There is an increased reliance on nondestructive evaluation (NDE) to provide accurate data about the health of materials in these aging systems. Examples of such structures include aircraft, bridges, nuclear reactors, roads, ships, industrial manufacturing facilities, storage vessels for both toxic and nontoxic substances, electronic hardware, etc. This book looks at ways to develop new NDE techniques for aging materials. Special emphasis is given to the structural health of concrete, defects in high-strength aircraft materials and the characterization of steels in nuclear reactors. One intriguing new technology, borrowed from the semiconductor industry, is the use of very small micro-electro-mechanical systems (MEMS) to monitor materials properties in situ. Using these devices in networks should permit both real-time monitoring of materials properties during operation and the anticipation of component failure. The book also explores the many potentially fertile collaborative research opportunities between NDE and noninvasive medical diagnostic procedures.

    Product details

    June 2014
    Paperback
    9781107413573
    360 pages
    229 × 152 × 19 mm
    0.48kg
    Unavailable - out of print
      Editors
    • Robert L. Crane , Wright Patterson Air Force Base, WPAFB, Ohio
    • Jan D. Achenbach , Northwestern University, Illinois
    • Surendra P. Shah , Northwestern University, Illinois
    • Theodore E. Matikas , University of Dayton, Ohio
    • Pierre T. Khuri-Yakub , Stanford University, California
    • Robert S. Gilmore , General Electric, Schenectady