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Dislocations and Deformation Mechanisms in Thin Films and Small Structures

Dislocations and Deformation Mechanisms in Thin Films and Small Structures

Dislocations and Deformation Mechanisms in Thin Films and Small Structures

Volume 673:
Oliver Kraft, Max-Planck-Institut für Metallforschung, Germany
Klaus W. Schwarz, IBM T J Watson Research Center, New York
Shefford P. Baker, Cornell University, New York
L. Ben Freund, Brown University, Rhode Island
Robert Hull, University of Virginia
September 2001
673
Hardback
9781558996090
AUD$54.50
exc GST
Hardback
Paperback

    The mechanical properties of small volumes of materials such as thin films and patterned structures can be very different from the mechanical properties of those same materials in bulk. Many explanations of the mechanical behaviors of such small volumes have depended on simplified models of dislocation behavior. However, recent developments in dislocation modeling have made it possible to understand dislocation behavior in much more detail than before. A wide range of topics is presented in these proceedings, including mechanisms of plastic deformation in heteroepitaxial, multilayered and polycrystalline thin films, as well as three-dimensional mesostructures such as epitaxial islands, semiconducting devices and microcrystallites. Experimental, theoretical and numerical simulations are addressed. Topics include: dislocation and deformation mechanisms in thin metal films and multilayers; discrete dislocations - observations and simulations; dislocations and deformation mechanisms in thin films and small structures; dislocations in small structures; dislocations and deformation in epitaxial layers; dislocation fundamentals -observations, calculations and simulations.

    Product details

    September 2001
    Hardback
    9781558996090
    248 pages
    228 × 152 mm
    0.455kg
    Available

    Table of Contents

    • Part I. Dislocation and Deformation Mechanisms in Thin Metal Films and Multilayers I
    • Part II. Discrete Dislocations: Observations and Simulations
    • Part III. Dislocations and Deformation Mechanisms in Thin Films and Small Structures
    • Part IV. Dislocations in Small Structures
    • Part V. Dislocations and Deformation in Epitaxial Layers
    • Part VI. Dislocation Fundamentals: Observations, Calculations and Simulations
    • Part VII. Dislocations and Deformation Mechanisms in Thin Metal Films and Multilayers II
    • Author index
    • Subject index.
      Editors
    • Oliver Kraft , Max-Planck-Institut für Metallforschung, Germany
    • Klaus W. Schwarz , IBM T J Watson Research Center, New York
    • Shefford P. Baker , Cornell University, New York
    • L. Ben Freund , Brown University, Rhode Island
    • Robert Hull , University of Virginia