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Degradation Processes in Nanostructured Materials

Degradation Processes in Nanostructured Materials

Degradation Processes in Nanostructured Materials

Volume 887:
Mircea Chipara, Indiana University
Orazio Puglisi, Università degli Studi di Catania, Italy
Ralph Skomski, University of Nebraska, Lincoln
Frank R. Jones, University of Sheffield
Benjamin S. Hsiao, State University of New York, Stony Brook
No date available
887
Paperback
9781107408913
Paperback

    As more advanced materials find their way into daily life, a better understanding of degradation processes is required, allowing us to more accurately predict their lifetime and further increase their performance, reliability. While degradation processes are initiated at molecular (subnanometer) scale, the nanostructure and nanoconfinement of materials alter the degradation processes occurring in materials at micron or larger scales, and eventually trigger new degradation routes. This book studies the effect of nanometer-scale structure and confinement on degradation processes and analyzes the experimental and theoretical approaches used to estimate the lifetime of nanostructured and nanoconfined materials in various environments. Various topics are addressed - from electronic, optical, structural, and magnetic nanomaterials to space, chemical, biological and medical applications. There is also an emphasis on the time dependence associated with artificial treatments involving electrical currents, annealing, and irradiation by various sources, such as gamma radiation and ions.

    Product details

    No date available
    Paperback
    9781107408913
    286 pages
    229 × 152 × 15 mm
    0.39kg

    Table of Contents

    • Part I. Degradation Processes in Carbon Nanotubes
    • Part II. Degradation Processes in Polymer-nanofiller Composites
    • Part III. Nanometer-scale Degradation Processes in Magnetic and Superconducting Materials
    • Part IV. Degradation Processes Induced by Particles and Ionizing Radiation
    • Part V. Degradation Processes at Nanometer Scale
    • Author index
    • Subject index.
      Editors
    • Mircea Chipara , Indiana University
    • Orazio Puglisi , Università degli Studi di Catania, Italy
    • Ralph Skomski , University of Nebraska, Lincoln
    • Frank R. Jones , University of Sheffield
    • Benjamin S. Hsiao , State University of New York, Stony Brook