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Chemical-Mechanical Planarization

Chemical-Mechanical Planarization

Chemical-Mechanical Planarization

Volume 767:
Duane S. Boning, Massachusetts Institute of Technology
Katia Devriendt, IMEC, Leuven, Belgium
Michael R. Oliver, Rodel Inc. Oregon, USA
David J. Stein, Sandia National Laboratories, New Mexico
Ingrid Vos, IMEC, Leuven, Belgium
No date available
767
Paperback
9781107409415
Paperback

    Chemical-mechanical planarization (CMP) has emerged as a critical fabrication technology for advanced integrated circuits. Even as the applications of CMP have diversified and we have begun to understand aspects of the physics and chemistry of the process, a new generation of CMP innovations is unfolding. New slurries and consumables are under development. New applications to novel devices continue to appear. This book, the most recent in a successful series on CMP, offers a review of the advances to date and provides a comprehensive discussion of the future challenges that must be overcome. Presentations from academia, government labs and industry are featured. Topics include; CMP modeling; CMP science; CMP slurries and particles for planarization of copper, oxide, and other materials; planarization applications including shallow trench isolation (STI), copper damascene, and novel devices and CMP integration.

    Product details

    No date available
    Paperback
    9781107409415
    364 pages
    229 × 152 × 19 mm
    0.49kg
      Editors
    • Duane S. Boning , Massachusetts Institute of Technology
    • Katia Devriendt , IMEC, Leuven, Belgium
    • Michael R. Oliver , Rodel Inc. Oregon, USA
    • David J. Stein , Sandia National Laboratories, New Mexico
    • Ingrid Vos , IMEC, Leuven, Belgium