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High Resolution Electron Microscopy of Defects in Materials

High Resolution Electron Microscopy of Defects in Materials

High Resolution Electron Microscopy of Defects in Materials

Volume 183:
Robert Sinclair, Stanford University, California
David J. Smith, Arizona State University
Ulrich Dahmen, Lawrence Berkeley Laboratory, Berkeley, California
June 2014
183
August 1990
Paperback
9781107410152
$35.99
USD
Paperback
USD
Hardback

    Product details

    June 2014
    August 1990
    Paperback
    9781107410152
    418 pages
    229 × 152 × 21 mm
    0.55kg
    Available
      Editors
    • Robert Sinclair , Stanford University, California
    • David J. Smith , Arizona State University
    • Ulrich Dahmen , Lawrence Berkeley Laboratory, Berkeley, California