Our systems are now restored following recent technical disruption, and we’re working hard to catch up on publishing. We apologise for the inconvenience caused. Find out more

Recommended product

Popular links

Popular links


High Resolution Electron Microscopy of Defects in Materials

High Resolution Electron Microscopy of Defects in Materials

High Resolution Electron Microscopy of Defects in Materials

Volume 183:
Robert Sinclair, Stanford University, California
David J. Smith, Arizona State University
Ulrich Dahmen, Lawrence Berkeley Laboratory, Berkeley, California
No date available
183
Paperback
9781107410152
Paperback

    Product details

    No date available
    Paperback
    9781107410152
    418 pages
    229 × 152 × 21 mm
    0.55kg
      Editors
    • Robert Sinclair , Stanford University, California
    • David J. Smith , Arizona State University
    • Ulrich Dahmen , Lawrence Berkeley Laboratory, Berkeley, California