Diagnostic Techniques for Semiconductor Materials Processing
Diagnostic Techniques for Semiconductor Materials Processing
Volume 324:
G. M. Crean, National Microelectronics Research Centre Cork, Ireland
O. J. Glembocki, Naval Research Laboratory, Washington, D.C.
G. Larrabee, Booz, Allen, & Hamilton, Dallas, Texas
S. W. Pang, University of Michigan, Ann Arbor
F. H. Pollak, Brooklyn College, City University of New York
O. J. Glembocki, Naval Research Laboratory, Washington, D.C.
G. Larrabee, Booz, Allen, & Hamilton, Dallas, Texas
S. W. Pang, University of Michigan, Ann Arbor
F. H. Pollak, Brooklyn College, City University of New York
No date available
324
Hardback
9781558992238
Hardback
Product details
No date availableHardback
9781558992238
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0.886kg
