Diagnostic Techniques for Semiconductor Materials Processing
Diagnostic Techniques for Semiconductor Materials Processing
Volume 324:
G. M. Crean, National Microelectronics Research Centre Cork, Ireland
O. J. Glembocki, Naval Research Laboratory, Washington, D.C.
G. Larrabee, Booz, Allen, & Hamilton, Dallas, Texas
S. W. Pang, University of Michigan, Ann Arbor
F. H. Pollak, Brooklyn College, City University of New York
O. J. Glembocki, Naval Research Laboratory, Washington, D.C.
G. Larrabee, Booz, Allen, & Hamilton, Dallas, Texas
S. W. Pang, University of Michigan, Ann Arbor
F. H. Pollak, Brooklyn College, City University of New York
July 1994
324
Out of stock in print form with no current plan to reprint
Hardback
9781558992238
£22.99
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Product details
July 1994Hardback
9781558992238
0 pages
0.886kg
Out of stock in print form with no current plan to reprint
