Our systems are now restored following recent technical disruption, and we’re working hard to catch up on publishing. We apologise for the inconvenience caused. Find out more

Recommended product

Popular links

Popular links


Microscopic Simulation of Interfacial Phenomena in Solids and Liquids

Microscopic Simulation of Interfacial Phenomena in Solids and Liquids

Microscopic Simulation of Interfacial Phenomena in Solids and Liquids

Volume 492:
Simon R. Philllpot, Argonne National Laboratory, Illinois
Paul D. Bristowe, University of Cambridge
David G. Stroud, Ohio State University
John R. Smith, General Motors, Warren, Michigan
June 2014
492
April 1998
Paperback
9781107413474
Out of Print
Paperback
USD
Hardback

    Microscopic characterization of interfaces and surfaces has progressed significantly due to the simultaneous development of experimental probes and theoretical approaches. Experimentally, it is possible to resolve the atomic structure of internal interfaces and free surfaces using techniques such as HREM and STM, and these impressive studies have been the focus of several MRS books. At the same time, the advent of parallel computers and high-performance workstations has led to more sophisticated and realistic microscopic computer simulations of materials using both classical and quantum mechanical methods. This book is the first to focus solely on the microscopic simulation of interfaces and brings together researchers interested in all classes of interfaces in both solids and liquids. and is organized around important interfacial properties: structure of fluid interfaces and surfaces; structure of solid interfaces and surfaces; chemical properties; dynamical processes; magnetic and dielectric properties; and elastic and mechanical properties.

    Product details

    June 2014
    April 1998
    Paperback
    9781107413474
    430 pages
    229 × 152 × 22 mm
    0.57kg
    Unavailable - out of print
      Editors
    • Simon R. Philllpot , Argonne National Laboratory, Illinois
    • Paul D. Bristowe , University of Cambridge
    • David G. Stroud , Ohio State University
    • John R. Smith , General Motors, Warren, Michigan