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Thin Films

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Thin Films

Thin Films

Stresses and Mechanical Properties IV
Volume 308:
Peter Børgesen, Cornell University, New York
John E. Sanchez, Jr., Advanced Micro Devices, Sunnyvale, California
Paul H. Townsend, Dow Chemical Company, Midland, Michigan
Timothy P. Weihs, Lawrence Livermore National Laboratory, California
No date available
308
Hardback
9781558992047
Hardback
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    No date available
    Hardback
    9781558992047
    0 pages
    1.227kg

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    About the authors
      Editors
    • Peter Børgesen , Cornell University, New York
    • John E. Sanchez, Jr. , Advanced Micro Devices, Sunnyvale, California
    • Paul H. Townsend , Dow Chemical Company, Midland, Michigan
    • Timothy P. Weihs , Lawrence Livermore National Laboratory, California

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