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Thin Films:

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Thin Films:

Thin Films:

Stresses and Mechanical Properties II
Volume 188:
M. Doerner, IBM General Products Division, San Jose, California
W. C. Oliver, Oak Ridge National Laboratory, Oak Ridge, Tennessee
G. M. Pharr, Rice University, Houston
F. R. Brotzen, Rice University, Houston
No date available
188
Paperback
9781107410114
Paperback
    Description

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    No date available
    Paperback
    9781107410114
    392 pages
    229 × 152 × 20 mm
    0.52kg

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    About the authors
      Editors
    • M. Doerner , IBM General Products Division, San Jose, California
    • W. C. Oliver , Oak Ridge National Laboratory, Oak Ridge, Tennessee
    • G. M. Pharr , Rice University, Houston
    • F. R. Brotzen , Rice University, Houston

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