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Advances in Surface and Thin Film Diffraction

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Advances in Surface and Thin Film Diffraction

Advances in Surface and Thin Film Diffraction

Volume 208:
Ting C. Huang, IBM Almaden Research Center, New York
Philip J. Cohen, University of Minnesota
David J. Eaglesham, AT&T Bell Laboratories, New Jersey
No date available
208
Paperback
9781107409989
Paperback
    Description

    Product details

    No date available
    Paperback
    9781107409989
    396 pages
    229 × 152 × 21 mm
    0.53kg

    Often bought together

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    Evolution of Thin-Film and Surface Structure and Morphology

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    Powder Diffraction is a quarterly journal published by the JCPDS-International Centre for Diffraction Data through Cambridge University Press. Powder Diffraction is a journal of practical technique, publishing articles relating to the widest range of application—from materials analysis to epitaxial growth of thin films and to the latest advances in software. Although practice is emphasized, theory is not neglected, especially as its discussion relates to better understanding of technique.2015 Impact Factor: 0.763

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    Contents

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    About the authors
      Editors
    • Ting C. Huang , IBM Almaden Research Center, New York
    • Philip J. Cohen , University of Minnesota
    • David J. Eaglesham , AT&T Bell Laboratories, New Jersey

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