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Thin Films

Thin Films

Thin Films

Stresses and Mechanical Properties XI
Volume 875:
Thomas E. Buchheit, Sandia National Laboratories, New Mexico
Andrew M. Minor, Lawrence Berkeley National Laboratory, California
Ralph Spolenak, ETH Zentrum, Switzerland
Kazuki Takashima, Kumamoto University, Japan
June 2014
875
October 2005
Unavailable - out of print April 2016
Paperback
9781107408937
Out of Print
Paperback
USD
Hardback

    This book has a long tradition of representing current topics in thin-film properties and how they are related to the performance and reliability of thin-film structures. Several emerging and well-developed technologies rely on understanding the behavior of these structures. This book provides a forum for an exchange of ideas among researchers who are interested in the mechanical behavior of thin films, broadly applied to their materials choice or methodology. The book focuses on stress-related phenomena in thin films for a wide range of materials. Of particular interest are studies that explore the frontiers of thin-film materials science with regard to materials selection or size scale. Topics include: elasticity in thin films; characterizing thin films by nanoindentation; mechanical behavior of nanostructured films; mechanical properties of thin; thin-film plasticity; thin-film plasticity; thin-film plasticity; novel testing techniques; in situ characterization techniques; adhesion and fracture of thin films; fatigue and stress in interconnect and metallization; deformation, growth and microstructure in thin films and thin-film processing.

    Product details

    June 2014
    October 2005
    Paperback
    9781107408937
    472 pages
    229 × 152 × 24 mm
    0.63kg
    Unavailable - out of print April 2016
      Editors
    • Thomas E. Buchheit , Sandia National Laboratories, New Mexico
    • Andrew M. Minor , Lawrence Berkeley National Laboratory, California
    • Ralph Spolenak , ETH Zentrum, Switzerland
    • Kazuki Takashima , Kumamoto University, Japan