Thin Films

Thin Films
Stresses and Mechanical Properties IV
Volume 308:
Peter Børgesen, Cornell University, New York
John E. Sanchez, Jr., Advanced Micro Devices, Sunnyvale, California
Paul H. Townsend, Dow Chemical Company, Midland, Michigan
Timothy P. Weihs, Lawrence Livermore National Laboratory, California
John E. Sanchez, Jr., Advanced Micro Devices, Sunnyvale, California
Paul H. Townsend, Dow Chemical Company, Midland, Michigan
Timothy P. Weihs, Lawrence Livermore National Laboratory, California
October 1993
308
Out of stock in print form with no current plan to reprint
Hardback
9781558992047
$29.99
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Product details
October 1993Hardback
9781558992047
0 pages
1.227kg
Out of stock in print form with no current plan to reprint
Often bought together
Often bought together

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- Peter Børgesen , Cornell University, New York
- John E. Sanchez, Jr. , Advanced Micro Devices, Sunnyvale, California
- Paul H. Townsend , Dow Chemical Company, Midland, Michigan
- Timothy P. Weihs , Lawrence Livermore National Laboratory, California
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