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Specimen Preparation for Transmission Electron Microscopy of Materials III

All titles
Specimen Preparation for Transmission Electron Microscopy of Materials III

Specimen Preparation for Transmission Electron Microscopy of Materials III

Volume 254:
Ron Anderson, IBM, East Fishkill Facility, Hopewell Junction, New York
John Bravman, Stanford University, California
Bryan Tracy, Advanved Micro Devices, Sunnyvale, California
April 1992
254
Hardback
9781558991484
AUD$43.95
inc GST
Hardback
    Description

    Product details

    April 1992
    Hardback
    9781558991484
    0 pages
    0.614kg
    Out of stock in print form with no current plan to reprint

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    About the authors
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    • Ron Anderson , IBM, East Fishkill Facility, Hopewell Junction, New York
    • John Bravman , Stanford University, California
    • Bryan Tracy , Advanved Micro Devices, Sunnyvale, California

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