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Phase Transformation Kinetics in Thin Films

Phase Transformation Kinetics in Thin Films

Phase Transformation Kinetics in Thin Films

Volume 230:
M. Chen, IBM Almaden Research Center, New York
M. O. Thompson, Cornell University, New York
R. B. Schwarz, Los Alamos National Laboratory
M. Libera, Stevens Institute of Technology, New Jersey
June 2014
230
Paperback
9781107409828
Out of Print
Paperback
Hardback

    The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

    Product details

    June 2014
    Paperback
    9781107409828
    386 pages
    229 × 152 × 20 mm
    0.52kg
    Unavailable - out of print

    Table of Contents

    • Part I. Sold State Amorphization
    • Part II. Metal-Metal Thin Film Reactions and Transformations
    • Part III. Semiconductor-Metal Reactions
    • Part IV. Crystallization, Amorphization and Epitaxy of Semiconductors
    • Part V. Laser Induced Transformations
    • Part VI. Ferroelectrics, Oxides and Ceramics.
      Contributors
    • Dieter Wolf, Sidney Yip, R. B. Schwarz, J. B. Rubin, G. Mazzone, A. Montone, M. Vittori Antisari, Dae-Hong Ko, Robert Sinclair, F.-Y. Shiau, S.-L. Chen, M. Loomans, Y. A. Chang, Kevin R. Coffey, Katayun Barmak, David A. Rudman, Simon Foner, John E. Sanchez, Jr, L. T. McKnelly, J. W. Morris, Jr, J. C. Lin, R. A. Hoffman, Alfred Cerezo, Jonathan M. Hyde, Mark G. Hetherington, Amanda K. Petford-Long, Warren J. Moberly, J. D. Busch, A. D. Johnson, Mitchell H. Berkson, A. C. Vermeulen, R. Delhez, E. J. Mittemeijer, Tai D. Nguyen, Ronald Gronsky, Jeffrey B. Kortright, Yang-Tse Cheng, Jeon-Kook Lee, J. H. Choy, Y. Choi, Z. Ma, L. H. Allen, B. BLanpain, Q. Z. Hong, J. W. Mayer, C. J. Palmstrom, Hideo Miura, En Ma, Carl V. Thompson, E. C. Zingu, B. T. Mofokeng, A. Buxbaum, M. Eizenberg, A. Raizmann, F. Schaffler, T. L. Lee, L. J. Chen, F. R. Chen, C. Vieu, A. Claverie, J. Faure, J. Beauvillain, Tomonori Yamaoka, Keiji Oyoshi, Takashi Tagami, Yasunori Arima, Shuhei Tanaka, L. Haji, P. Joubert, M. Guendouz, N. Duhamel, B. Loisel, F. Demichelis, C. F. Pirri, E. Tresso, L. Battezzati, E. Giamello, P. Menna, Toyohiko J. Konno, F. Lin, M. K. Hatalis, S. Girginoudi, D. Girginoudi, N. Georgoulas, A. Thanalakis, S. Batra, K. Park, M. Lobo, S. Banerjee, Viju K. Matthews, William R. Miller, Jr, W. J. Boettinger, W. F. Tseng, Joseph Pellegrino, J. Comas, S. Qadri, W. Tseng, Roy Clarke, Waldemar Dos Passos, Walter Lowe, Brian Rodricks, Cristine Brizard, Toshihiro Shimada, Fumio S. Ohuchi, Bruce A. Parkinson, Kurt A. Rubin, D. Strand, J. Gonzalez-Hernandez, B. S. Chao, S. R. Ovshinsky, P. Gasiorowski, D. A. Pawlik, Yih Chang, J. Chen, S. Talwar, E. Y. Shu, Thomas W. Sigmon, O. Knotek, F. Löffler, Carlos A. Paz de Araujo, L. D. McMillan, J. F. Scott, A. Pignolet, P. E. Schmid, L. Wang, F. Lévy, Vinay Chikarmane, Chandra Sudhama, Jiyoumg Kim, Jack Lee, Al Tasch, Z. C. Chang, A. Gupta, M. J. McKelvy, L. Eyring, S. K. Dey, Hyung-Jin Jung, Chong-Hee Kim, T. S. Kalkur, J. R. Kulkarni, R. Y. Kwor, L. Levinson, L. Kammerdiner, C. K. Chiang, W. Wong-Ng, P. K. Scheneck, L. P. Cook, M. D. Vaudin, P. S. Brody, B. J. Rod, K. W. Bennett, Gregory J. Exarhos, Nancy J. Hess, K. Yamamoto, B. M. Lairson, J. C. Bravman, T. H. Geballe, Jian Li, K. N. Tu, J. W. Mayer, T. C. Chou, T. G. Nieh, Scott Summerfelt, C. Barry Carter, Chang Hwan Chun, Geun Hong Kim, Kyoung-Soo Yi

    • Editors
    • M. Chen , IBM Almaden Research Center, New York
    • M. O. Thompson , Cornell University, New York
    • R. B. Schwarz , Los Alamos National Laboratory
    • M. Libera , Stevens Institute of Technology, New Jersey