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Electronic Packaging Materials Science X

Electronic Packaging Materials Science X

Electronic Packaging Materials Science X

Volume 515:
Daniel J. Belton, Intel Corporation, Chandler, Arizona
Michael Gaynes, IBM Corporation, Endicott, New York
Elizabeth G. Jacobs, Texas Instruments, Dallas
Raymond Pearson, Lehigh University, Pennsylvania
Tien Wu, IBM Microelectronics, Endicott, New York
October 1998
515
Out of stock in print form with no current plan to reprint
Hardback
9781558994218
£22.99
GBP
Hardback

    Advanced packaging applications are demanding increasingly more innovative materials sets in order to ensure overall package reliability. In addition, as we migrate towards higher-density inter-connects, the assembly operation will require new processes and process materials to guarantee both performance and manufacturability. This book explores the questions of materials, processes and reliability for high-density package solutions. The book is strengthened by invited and contributed papers from a host of national and international experts. Topics include: interfacial adhesion behavior; flip-chip interconnections; high-density substrates; thermomechanical behavior and packaging reliability issues.

    Product details

    October 1998
    Hardback
    9781558994218
    262 pages
    0.614kg
    Out of stock in print form with no current plan to reprint
      Editors
    • Daniel J. Belton , Intel Corporation, Chandler, Arizona
    • Michael Gaynes , IBM Corporation, Endicott, New York
    • Elizabeth G. Jacobs , Texas Instruments, Dallas
    • Raymond Pearson , Lehigh University, Pennsylvania
    • Tien Wu , IBM Microelectronics, Endicott, New York