Atomic Resolution Microscopy of Surfaces and Interfaces
There has been a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this book is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.
Product details
September 1997Hardback
9781558993709
282 pages
0.568kg
Out of stock in print form with no current plan to reprint