Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures
Impurities, Defects and Diffusion in Semiconductors: Bulk and Layered Structures
Volume 163:
Donald J. Wolford, IBM T J Watson Research Center, New York
Jerzy Bernholc, North Carolina State University
Eugene E. Haller, University of California, Berkeley
Jerzy Bernholc, North Carolina State University
Eugene E. Haller, University of California, Berkeley
June 2014
163
Unavailable - out of print
Paperback
9781107410305
Out of Print
Paperback
Hardback
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Product details
June 2014Paperback
9781107410305
1086 pages
229 × 152 × 54 mm
1.42kg
Unavailable - out of print
Table of Contents
- Preface
- Acknowledgments
- Materials Research Society symposium proceedings
- Part I. Electronic Structure - Deep Levels
- Part II. Electronic Structure - Shallow Impurities
- Part III. Electronic Structures - Native Defects, Complexes, Transition Metals in Compounds
- Part IV. Electronic Structure - Complexes in Silicon
- Part V. Electronic Structure - Superlattices
- Part VI. Hydrogen in Silicon
- Part VII. Hydrogen in III-Vs
- Part VIII. Diffusion in Silicon and Germanium
- Part IX. Diffusion in Compounds
- Part X. Diffusion in Superlattices
- Part XI. DX Centers
- Part XII. EL2 Centers
- Part XIII. Doping in III-Vs
- Part XIV. Ordering in Alloys
- Part XV. Processing of Silicon and Germanium
- Part XI. Processing of Compounds
- Author index
- Subject index.
