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High Resolution Electron Microscopy of Defects in Materials

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High Resolution Electron Microscopy of Defects in Materials

High Resolution Electron Microscopy of Defects in Materials

Volume 183:
Robert Sinclair, Stanford University, California
David J. Smith, Arizona State University
Ulrich Dahmen, Lawrence Berkeley Laboratory, Berkeley, California
August 1990
183
Temporarily unavailable - available from TBC
Hardback
9781558990722
CAD$46.95
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    Product details

    August 1990
    Hardback
    9781558990722
    420 pages
    229 × 152 × 24 mm
    0.73kg
    Temporarily unavailable - available from TBC

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    About the authors
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    • Robert Sinclair , Stanford University, California
    • David J. Smith , Arizona State University
    • Ulrich Dahmen , Lawrence Berkeley Laboratory, Berkeley, California

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