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Thin Films:

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Thin Films:

Thin Films:

Stresses and Mechanical Properties I
Volume 130:
John C. Bravman, Stanford University, California
William D. Nix, Stanford University, California
David M. Barnett, Stanford University, California
David A. Smith, IBM Research Center, Yorktown Heights, New York
No date available
130
Paperback
9781107410855
Paperback
    Description

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    No date available
    Paperback
    9781107410855
    428 pages
    229 × 152 × 22 mm
    0.57kg

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    Contents

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    About the authors
      Editors
    • John C. Bravman , Stanford University, California
    • William D. Nix , Stanford University, California
    • David M. Barnett , Stanford University, California
    • David A. Smith , IBM Research Center, Yorktown Heights, New York

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