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Specimen Preparation for Transmission Electron Microscopy of Materials III

Specimen Preparation for Transmission Electron Microscopy of Materials III

Specimen Preparation for Transmission Electron Microscopy of Materials III

Volume 254:
Ron Anderson, IBM, East Fishkill Facility, Hopewell Junction, New York
John Bravman, Stanford University, California
Bryan Tracy, Advanved Micro Devices, Sunnyvale, California
No date available
254
Hardback
9781558991484
Hardback

    Product details

    No date available
    Hardback
    9781558991484
    0 pages
    0.614kg
      Editors
    • Ron Anderson , IBM, East Fishkill Facility, Hopewell Junction, New York
    • John Bravman , Stanford University, California
    • Bryan Tracy , Advanved Micro Devices, Sunnyvale, California