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Advanced Technologies in Failure Prevention

Advanced Technologies in Failure Prevention

Advanced Technologies in Failure Prevention

Proceedings of the 43rd Meeting of the Mechanical Failures Prevention Group
T. Robert Shives
June 1991
Hardback
9780521412261
Out of Print
Hardback

    The demand for safety and reliability in complex structures and mechanical systems is increasing as performance standards are escalated. The costs associated with premature or unexpected component failure require a continued need to employ the latest advances in science and engineering to assess performance throughout the life cycle. A significant contributor to the escalating costs of modern complex systems is that associated with the many maintenance actions required to keep the systems operational.
    The theme of this book is the improvement in mechanical systems through the application of advanced technology. Emphasis is placed on developments in instrumentation and techniques for detection, diagnosis, and prognosis, on the evaluation of materials durability and on mechanisms of failure in aircraft and industrial applications.

    Product details

    June 1991
    Hardback
    9780521412261
    270 pages
    262 × 180 × 23 mm
    0.694kg
    170 b/w illus. 32 tables
    Unavailable - out of print June 2009

    Table of Contents

    • Part I. Overview of Mechanical Failure Prevention Programs
    • Detection, diagnosis and prognosis
    • 1. Aircraft applications
    • 2. Industrial applications
    • 3. Instrumentation
    • Part II. Materials Durability and Mechanisms of Failure:
    • 4. Analytical techniques in materials durability evaluation
    • 5. Advanced concepts in materials durability evaluation
    • 6. Aircraft applications
    • Appendix.
      Contributors
    • J. A. Ray, W. A. Koelsch, R. M. Stewart, S. R. Low III, D. E. Harne, R. J. Fields, P. V. Madhaven, C. B. Meher-Homji, G. Mani, S. Nakashima, T. Toyota, S. Kawasaki, H. Komura, R. K. Wharton, R. Smith, J. Bambara, J. J. Daly, P. J. Sherman, K. N. Lou, W. A. Watts, J. E. Palm, G. Gulbrandsen, F. D. Ju, T. Y. Chen, P. W. Whaley, B. S. Haisty, R. J. Duerr, W. T. Springer, J. P. Dempsey, H. Li, W. C. Boyce, J. P. Pershbacher, S. R. Wright, H. R. Voorhees, S. G. Fritz, P. G. Loges, C. C. Blatchley, D. G. Grandjean, A. L. Geraci, E. Guglielmino, G. La Rosa, A. S. Kahn, X. Wang, S. S. Shah, R. D. Evans, M. Carr, J. M. O'Donnell, S. Zhizhao, K. Hao