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Thin Films:

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Thin Films:

Thin Films:

Stresses and Mechanical Properties I
Volume 130:
John C. Bravman, Stanford University, California
William D. Nix, Stanford University, California
David M. Barnett, Stanford University, California
David A. Smith, IBM Research Center, Yorktown Heights, New York
June 2014
130
April 1989
Paperback
9781107410855
$35.99
USD
Paperback
USD
Hardback
    Description

    Product details

    June 2014
    April 1989
    Paperback
    9781107410855
    428 pages
    229 × 152 × 22 mm
    0.57kg
    Available

    Often bought together

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    About the authors
      Editors
    • John C. Bravman , Stanford University, California
    • William D. Nix , Stanford University, California
    • David M. Barnett , Stanford University, California
    • David A. Smith , IBM Research Center, Yorktown Heights, New York

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