Our systems are now restored following recent technical disruption, and we’re working hard to catch up on publishing. We apologise for the inconvenience caused. Find out more

Item added to bagSorry, there was a problem getting your bag informationItem cannot be purchased with the existing contents of your bagItem unavailable online
✕

was added to your bag.

Please try again.

Sorry, this item cannot be purchased in the same transaction as the existing items in your bag.

Please complete the purchase of the items currently in your bag and then add this item in a separate transaction or visit Shopping Help.

Sorry, this product is not currently available to buy online. Please visit Shopping Help.

View bag and checkout
Remove item
✕

Are you sure you want to remove from your bag?

Recommended product

Popular links

Popular links

Thin Films:

All titles
Thin Films:

Thin Films:

Stresses and Mechanical Properties I
Volume 130:
John C. Bravman, Stanford University, California
William D. Nix, Stanford University, California
David M. Barnett, Stanford University, California
David A. Smith, IBM Research Center, Yorktown Heights, New York
April 1989
130
Out of stock in print form with no current plan to reprint
Hardback
9781558990036
£29.99
GBP
Hardback
Paperback
    Description

    Product details

    April 1989
    Hardback
    9781558990036
    0 pages
    228 × 152 mm
    0.864kg
    Out of stock in print form with no current plan to reprint

    Often bought together

    Dislocations and Deformation Mechanisms in Thin Films and Small Structures
    Dislocations and Deformation Mechanisms in Thin Films and Small Structures

    : Hardback

    Oxide Semiconductors and Thin Films
    Oxide Semiconductors and Thin Films

    : Hardback

    Artificially Induced Grain Alignment in Thin Films
    Artificially Induced Grain Alignment in Thin Films

    : Paperback

    Synthesis, Characterization, and Applications of Functional Materials – Thin Films and Nanostructures
    Synthesis, Characterization, and Applications of Functional Materials – Thin Films and Nanostructures

    : Hardback

    Often bought together

    cambridge core banner

    Related Journals

    Powder Diffraction
    Powder Diffraction

    : Journal

    Powder Diffraction is a quarterly journal published by the JCPDS-International Centre for Diffraction Data through Cambridge University Press. Powder Diffraction is a journal of practical technique, publishing articles relating to the widest range of application—from materials analysis to epitaxial growth of thin films and to the latest advances in software. Although practice is emphasized, theory is not neglected, especially as its discussion relates to better understanding of technique.2015 Impact Factor: 0.763

    Related Journals

    Also by this Author

    Imperfections in Crystalline Solids
    Imperfections in Crystalline Solids

    William D. Nix

    :Hardback

    £56.00 GBP
    View product

    Also by this Author

    Contents
    Courses
    Resources
    Additional Information
    About the authors
      Editors
    • John C. Bravman , Stanford University, California
    • William D. Nix , Stanford University, California
    • David M. Barnett , Stanford University, California
    • David A. Smith , IBM Research Center, Yorktown Heights, New York

    Browse by related subject

     
    ✕

    Sorry, this item cannot be purchased in the same transaction as the existing items in your cart.

    Please complete the purchase of the items currently in your cart and then add this item in a separate transaction or contact

    Customer Services