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The Science of Crystallization

The Science of Crystallization

The Science of Crystallization

Macroscopic Phenomena and Defect Generation
William A. Tiller, Stanford University, California
May 1992
Paperback
9780521388283
$96.00
USD
Paperback
USD
eBook

    This book, together with its companion volume The Science of Crystallization: Microscopic Interfacial Phenomena, make up a complete course that will teach an advanced student how to understand and analyse scientifically any of the phenomena that are observed during natural or technological crystallization from any medium and via any technique. It is an advanced text that goes into considerable detail concerning the many elements of knowledge needed to understand both quantitatively and qualitatively a crystallization event. Both the present book and its companion volume are sufficiently broad to provide the scientific basis necessary to address any area of application. The book and its companion can be used independently of each other, and together they provide the basis for advanced courses on crystallization in departments of materials science, metallurgy, electrical engineering, geology, chemistry, chemical engineering and physics. In addition the books will be invaluable to scientists and engineers in the solid state electronics, optoelectronics, metallurgical and chemical industries involved in any form of crystallization and thin film formation.

    • Together with volume 1 makes a complete course for advanced students
    • Cross-disciplinary key text on crystallisation
    • Interdisciplinary, will be used by physicists, chemists, materials scientists
    • Two volumes can be used independently

    Product details

    May 1992
    Paperback
    9780521388283
    520 pages
    235 × 156 × 30 mm
    0.742kg
    272 b/w illus. 21 tables
    Available

    Table of Contents

    • Preface
    • Symbols
    • 1. Introduction
    • 2. Convection and heat transfer
    • 3. Steady state solute partitioning
    • 4. Macroscopic and microscopic solute redistribution
    • 5. Morphological stability of interfaces
    • 6. Dynamic interface morphologies
    • 7. Physical defect generation during bulk crystal growth
    • 8. Defect generation during thin film formation
    • References
    • Index.
      Author
    • William A. Tiller , Stanford University, California