Our systems are now restored following recent technical disruption, and we’re working hard to catch up on publishing. We apologise for the inconvenience caused. Find out more

Recommended product

Popular links

Popular links


Polycrystalline Thin Films

Polycrystalline Thin Films

Polycrystalline Thin Films

Structure, Texture, Properties and Applications II
Volume 403:
Harold J. Frost, Dartmouth College, New Hampshire
Elizabeth A. Holm, Sandia National Laboratories, Alburquerque
Michael A. Parker, IBM Storage, Systems Division, San Jose
Caroline A. Ross, Komag, Inc. Milpitas, California
September 1996
403
Out of stock in print form with no current plan to reprint
Hardback
9781558993068
£22.99
GBP
Hardback

    This interdisciplinary book brings together researchers from a wide range of scientific fields to offer insights into the nature of polycrystalline thin films. These films have properties that are different from those of a bulk polycrystal and from those of a single crystal film. In particular, the volume focuses on film deposition and processing techniques which allow the fabrication of films with innovative microstructures and technologically relevant properties. The work presented ranges from theoretical studies to technological applications. Topics include: microstructural evolution; interfaces and mechanical properties; characterization of microstructure; hard and refractory films; polycrystalline silicon; electrical properties; optical properties; gas sensors; ferroelectric films; metallization; and magnetic and MEMS applications.

    Product details

    September 1996
    Hardback
    9781558993068
    753 pages
    1.227kg
    Out of stock in print form with no current plan to reprint
      Editors
    • Harold J. Frost , Dartmouth College, New Hampshire
    • Elizabeth A. Holm , Sandia National Laboratories, Alburquerque
    • Michael A. Parker , IBM Storage, Systems Division, San Jose
    • Caroline A. Ross , Komag, Inc. Milpitas, California