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Magnetic and Electronic Films – Microstructure, Texture and Application to Data Storage

Magnetic and Electronic Films – Microstructure, Texture and Application to Data Storage

Magnetic and Electronic Films – Microstructure, Texture and Application to Data Storage

Volume 721:
Patrick W. DeHaven, IBM Corporation, New York
David P. Field, Washington State University
Samuel D. Harkmess, Seagate Technologies LLC, California
John A. Sutliff, HKL Technology, Inc. New York
Jerzy a. Szpunar, McGill University, Montréal
Li Tang, IBM Storage Systems Division, California
Thomas Thomson, IBM Almaden Research Center, California
Mark D. Vaudin, National Institute of Standards and Technology, Maryland
August 2002
721
Unavailable - out of print
Hardback
9781558996571
Out of Print
Hardback
Paperback

    This book, first published in 2002, provides an interdisciplinary discussion of magnetic and electronic films and the importance of new materials in magnetic data storage is underlined by the accelerating pace of areal density growth. It covers a wide range of novel materials with data- storage potential. In particular, new work on lithographically-defined nanostructures and nanowires shows exciting possibilities for the future, including patterned media and magnetic logic operations. New work on chemical methods to produce ferromagnetic particles less than 10nm in diameter, with extremely narrow size distributions, indicates promise. Presentations also reflect the growing interest in textural and microstructural control in thin-film technology. Materials systems in which links between crystallographic texture, microstructure and properties are studied including metal films, electronic films including ferroelectrics, and transparent conducting oxides. Presentations display a significant variation in the sophistication of texture-measurement techniques, depending on application and equipment availability. The technique of electron backscatter diffraction (EBSD is strongly featured.

    Product details

    August 2002
    Hardback
    9781558996571
    328 pages
    229 × 152 × 6 mm
    1.9kg
    Unavailable - out of print
      Editors
    • Patrick W. DeHaven , IBM Corporation, New York
    • David P. Field , Washington State University
    • Samuel D. Harkmess , Seagate Technologies LLC, California
    • John A. Sutliff , HKL Technology, Inc. New York
    • Jerzy a. Szpunar , McGill University, Montréal
    • Li Tang , IBM Storage Systems Division, California
    • Thomas Thomson , IBM Almaden Research Center, California
    • Mark D. Vaudin , National Institute of Standards and Technology, Maryland