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Low-Dielectric Constant Materials II

Low-Dielectric Constant Materials II

Low-Dielectric Constant Materials II

Volume 443:
Helmuth Treichel, Fraunhofer Institute Munich
Anthony C. Jones, Epichem, Ltd. Wirral Merseyside
André Lagendijk, Schumacher Carlsbad, California
Kevin J. Uram, Lam Research Corporation Fremont, California
August 1997
443
Out of stock in print form with no current plan to reprint
Hardback
9781558993471
$29.99
USD
Hardback

    Low-dielectric constant materials are needed to improve the performance and speed of future integrated circuits. In fact, the diversity of contributors to this book is testimony to the global significance of the topic to the future of semiconductor manufacturing. Presentations include those by semiconductor equipment manufacturers and chemical source suppliers, academia from six countries, four government laboratories and five major device manufacturers. Approaches to designing and implementing reduction in dielectric constant for intermetal dielectric materials are featured and range from the evolution of silicon dioxide to fluorinated silicate glass, to the use of inorganic/organic polymers and spin-on-material, to fluorinated diamond-like carbon and nanoporous silica. The book also addresses the practical aspects of the use of low-dielectric constant materials such as chemical mechanical polishing of these materials and optimization of wiring delays in devices utilizing low-k material.

    Product details

    August 1997
    Hardback
    9781558993471
    203 pages
    234 × 156 mm
    0.477kg
    Out of stock in print form with no current plan to reprint
      Editors
    • Helmuth Treichel , Fraunhofer Institute Munich
    • Anthony C. Jones , Epichem, Ltd. Wirral Merseyside
    • André Lagendijk , Schumacher Carlsbad, California
    • Kevin J. Uram , Lam Research Corporation Fremont, California