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Diagnostic Techniques for Semiconductor Materials Processing

All titles
Diagnostic Techniques for Semiconductor Materials Processing

Diagnostic Techniques for Semiconductor Materials Processing

Volume 324:
G. M. Crean, National Microelectronics Research Centre Cork, Ireland
O. J. Glembocki, Naval Research Laboratory, Washington, D.C.
G. Larrabee, Booz, Allen, & Hamilton, Dallas, Texas
S. W. Pang, University of Michigan, Ann Arbor
F. H. Pollak, Brooklyn College, City University of New York
July 1994
324
Hardback
9781558992238
AUD$44.95
inc GST
Hardback
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    July 1994
    Hardback
    9781558992238
    0 pages
    0.886kg
    Temporarily unavailable - available from TBC

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    • G. M. Crean , National Microelectronics Research Centre Cork, Ireland
    • O. J. Glembocki , Naval Research Laboratory, Washington, D.C.
    • G. Larrabee , Booz, Allen, & Hamilton, Dallas, Texas
    • S. W. Pang , University of Michigan, Ann Arbor
    • F. H. Pollak , Brooklyn College, City University of New York

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