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Chemical-Mechanical Planarization

Chemical-Mechanical Planarization

Chemical-Mechanical Planarization

Volume 767:
Duane S. Boning, Massachusetts Institute of Technology
Katia Devriendt, IMEC, Leuven, Belgium
Michael R. Oliver, Rodel Inc. Oregon, USA
David J. Stein, Sandia National Laboratories, New Mexico
Ingrid Vos, IMEC, Leuven, Belgium
August 2003
767
Out of stock in print form with no current plan to reprint
Hardback
9781558997042
£29.99
GBP
Hardback
Paperback

    Chemical-mechanical planarization (CMP) has emerged as a critical fabrication technology for advanced integrated circuits. Even as the applications of CMP have diversified and we have begun to understand aspects of the physics and chemistry of the process, a new generation of CMP innovations is unfolding. New slurries and consumables are under development. New applications to novel devices continue to appear. This book, the most recent in a successful series on CMP, offers a review of the advances to date and provides a comprehensive discussion of the future challenges that must be overcome. Presentations from academia, government labs and industry are featured. Topics include; CMP modeling; CMP science; CMP slurries and particles for planarization of copper, oxide, and other materials; planarization applications including shallow trench isolation (STI), copper damascene, and novel devices and CMP integration.

    Product details

    August 2003
    Hardback
    9781558997042
    348 pages
    228 × 152 mm
    0.591kg
    Out of stock in print form with no current plan to reprint
      Editors
    • Duane S. Boning , Massachusetts Institute of Technology
    • Katia Devriendt , IMEC, Leuven, Belgium
    • Michael R. Oliver , Rodel Inc. Oregon, USA
    • David J. Stein , Sandia National Laboratories, New Mexico
    • Ingrid Vos , IMEC, Leuven, Belgium