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Advances in Surface and Thin Film Diffraction

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Advances in Surface and Thin Film Diffraction

Advances in Surface and Thin Film Diffraction

Volume 208:
Ting C. Huang, IBM Almaden Research Center, New York
Philip J. Cohen, University of Minnesota
David J. Eaglesham, AT&T Bell Laboratories, New Jersey
June 2014
208
Unavailable - out of print
Paperback
9781107409989
Out of Print
Paperback
Hardback
    Description

    Product details

    June 2014
    Paperback
    9781107409989
    396 pages
    229 × 152 × 21 mm
    0.53kg
    Unavailable - out of print

    Often bought together

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    Contents

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    About the authors
      Editors
    • Ting C. Huang , IBM Almaden Research Center, New York
    • Philip J. Cohen , University of Minnesota
    • David J. Eaglesham , AT&T Bell Laboratories, New Jersey

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